Probe C

$25.00

Probe Data Sheet

Cantilever arrays of silicon nitride probes designed for a variety of applications

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  • Description

    Product Description

    Probe Type, C

    Probe Design, Multiple Cantilever

    Cantilever arrays of silicon nitride probes designed for a variety of applications.

    • Side C-1: 5-cantilever array with 4 of the cantilevers designed for multi-patterning, referred to as fabrication probes.  The wider cantilever is designed for laser alignment and imaging.
    • Side C-2:  2 different arrays: Probe array C-2a (on the top right) is a simple 2-cantilever array. Probe array C-2b (on the bottom right) is similar to C-1, but is a stiffer array of 10 fabrication probes and 1 imaging probes

    Note: Probes bought in quantities greater than 300 will be supplied in a wafer format. A chip cracker kit is highly recommend and is available under Accessories as shown under related products.

     

    Nominal Specifications

    Probe

    # Fabrication Probes

    Pitch (µm)

    Imaging k (N/m)

    Imaging Length (µm)

    Imaging Width (µm)

    Fabrication k (N/m)

    Fabrication Length (µm)

    Fabrication Width

    (µm)

    C-1

    3

    30

    0.06

    175

    45

    0.03

    175

    25

    C-2a

    2

    60

    0.1

    150

    45

    C-2b

    10

    35

    0.06

    175

    45

    0.05

    150

    25

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