ACST Atomic Force Microscope (AFM) is a state-of-the-art instrument and has been designed in a bottoms-up approach for both ease-of-use and robustness. It is a truly multidisciplinary metrology and industry standard tool.

Research and Education Ready 
Robust & Multi-mode instrument (vibrating, non-vibrating, LFM, Conductive and Lithography)
Low cost of ownership
Modular Concept

Modes: Vibrating, Non Vibrating, Phase, Lateral Force Microscopy (LFM)

  Z drive resolution < 0.075 nm

 50-micron scan range

 XY drive resolution: 1 nm open loop

 3 mega-pixel CCD color camera

 Video microscope (45x – 400x)

 Linearized 60 μm X-Y scanner

 Easy probe loader

Conductive Cell: The ACST conductive-AFM (C-AFM) accessory provides surface conductivity images when used as an accessory with ACST AFM. The CAFM creates images showing pixel-by-pixel conductivity. Conductivity is measured using any DC voltage (from -10 to +10 volts) with currents ranging from picoamps to 10 microamps.

Enviornmental Cell: The ACST environmental AFM cell is used for scanning samples in liquid or inert gas under a controlled environment. The environmental cell is a sealed chamber with an inlet and outlet ports used to introduce liquids or gases of interest to run an experiment. It is designed in such a way to hold the AFM tip and the sample under the desired environment.

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