Affordable. Compact. High Resolution. Robust.

Scanning Electron Microscope (SEM) is a precision instrument that can be used for analyzing the shapes or constituents of microstructure materials in quantitative and qualitative at the nm scale. It is an essential tool for visualization and accu-rate measurements of nanostructures. COXEM SEM offers a perfect balance be-tween affordability and performance, especially when sub nanometer imaging is becoming a standard. This instrument is designed to maintain robustness, afforda-bility and ease-of-use. The SEM is a truly multidisciplinary metrology and industry standard tool in countless engineering and research fields and used in chemistry, biology, material science as well as nano-materials and nano-biology.


· Precise & high quality images <5 nm resolution or better
· Accurate depiction of materials at the nanoscale
· Auto focus and fine focus
· High magnification
· Stage position
· Filament memory
· Auto stage, click and move
· Portable, designed to fit even in small lab space
· Modular design – easy to service and maintain. None to little downtime

Technical Features: 

· Back Scattered Electron Detector
· Secondary Electron Detector
· Accelerating voltage: 1~30kV variable
· Spatial Resolution: <5 nm
· Magnification 20,000 to 150,000x
· Auto stage: X 35 mm, Y 35 mm, T 0 to 45o axis
· Tungsten filament
· Secondary Electron Detector

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