NP-AFM
The NP-AFM is a complete nanoprofiler tool including everything required for scanning samples: microscope stage, electronic box, control computer, probes, manuals, and a video microscope. Samples as large as 200 x 200 x 20 mm are profiled by the NP-AFM system, and several stage options areavailable for many types of samples.
Nanoprofiler AFM for technical samples, wafers and discs
Three sample stage options to accommodate substrates up to 200 x 200 x 20 mm
Integrated high resolution video microscope
Linearized XY piezoelectric scanner
Accommodates standard-sized AFM probes
Includes vibrating and non-vibrating topography modes, plus lateral force and phase mode imaging
Utilizes a direct drive motorized probe approach
Captures images with intuitive LabVIEW™-based software
