The NP-AFM is a complete nanoprofiler tool including everything required for scanning samples: microscope stage, electronic box, control computer, probes, manuals, and a video microscope. Samples as large as 200 x 200 x 20 mm are profiled by the NP-AFM system, and several stage options areavailable for many types of samples.

 Nanoprofiler AFM for technical samples, wafers and discs

 Three sample stage options to accommodate substrates up to 200 x 200 x 20 mm

 Integrated high resolution video microscope

 Linearized XY piezoelectric scanner

 Accommodates standard-sized AFM probes

 Includes vibrating and non-vibrating topography modes, plus lateral force and phase mode imaging

 Utilizes a direct drive motorized probe approach

 Captures images with intuitive LabVIEW™-based software

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