EM-30AX
NAVIGATION TO NANOWORLD WITH EM
How do you stay ahead of the competition when it comes to nanoscale? By providing your researchers and students access to world class metrology tools. ACS-T brings to you COXEM EM 30: Table-top SEM for industry, institutions and school. The EM series makes it possible to obtain high resolution quality images and critical data at the nano scale but unlike other SEMs, does not come with a steep price tag. EM-30 is an excellent fit where space is limited. The performance and price point for EM series makes it an attractive and affordable option for institutions and industry alike.
Magnification: ~ x 100,000
EDS Functions: C(6) to U(92) element, 133eV resolution at 5.89keV Mn, 80eV fluorine Up to 1,000,000 X-ray input counts per second and up to 300,000 stored X-ray counts per second
Accelerating Voltage: 1kV, 1kV/3kV/5kV/10kV/15kV/20kV/30kV
Image: Secondary Electron Image (SEI)
Resolution: 7 nm
XY Stage: 35 x 35 mm²
Stage Rotation: 360°
Sample size: 60 mm (D), 45 mm (H)
