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Conductive Contact Mode
Diamond Probes From: $950.00These probes are designed for conducting scanning probe microscopy (C-AFM), Oxidation lithography, E-Chem AFM, Piezo-Force microscopy and SSRM. These probes feature high electrical conductivity and they are not like the metal coated probes. These probes are totally conductive. Additionally, the apex of less than 10 nm radius is respectively sharp when compared to the metal coated probes which gives unprecedented topographic and electrical resolution. Here are the properties of these tips:
- No tip wear/Extremely durable
- No tip shape degradation
- Low friction
- Suitable for bio-applications
- Enables unparalleled resolution
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Conductive Non-Contact Mode
Diamond Probes From: $950.00These probes are designed for non-contact imaging, C-AFM, oxidation lithography, nano-indentation and nano-scratching applications. Can be used also for imaging in contact mode in air or liquid on hard surfaces. Here are the properties of these tips:
- Extreme hardness, for indenting many surfaces
- Extreme wear resistance, no change after many scans
- Extremely strong, as strong as a single-crystal diamond
- Very low friction, coefficients of friction 0.03 in air
- Low stickiness, Hydrophobic surface
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Contact Mode
Diamond Probes $1,050.00These probes are designed for contact imaging on soft material. Thanks to their ultra-small diamond structure, their surfaces are extremely smooth and exhibit low friction, yet they retain the extreme wear and chemical resistance and inertness, which is critical when imaging soft material. Here are the properties of these tips:
- Scanning soft and hard surfaces in contact mode
- Quality control
- Long tip life time
- Bio friendly due to its low surface energy which leads to superior imaging performance on soft, sticky samples such as protein, polymers, DNA, viruses, bacteria and cells
- Resist fouling and build-up of debris when imaging soft material
- Low friction which inhibits sample damage during imaging
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Scanning Spread Resistance Microscopy
Diamond Probes From: $1,400.00These probes are designed for Scanning Spreading Resistance Microscopy (SSRM) which enables simultaneous topographic imaging and 2D carrier density mapping on the surface of semiconductor samples. In addition these probes can be used for nano-indentation and nano-scratching applications. These probes can be used for imaging in contact mode, in air, liquid, on hard surfaces and non-contact mode. Here are the properties of these tips:
- Extreme hardness, for indenting many surfaces
- Extreme wear resistance, no change after many scans
- Extremely strong, as strong as a single-crystal diamond
- Very low friction, coefficients of friction 0.03 in air
- Low stickiness, Hydrophobic surface