• Contact Mode


    Data Sheet

    These probes are designed for contact imaging on soft material. Thanks to their ultra-small diamond structure, their surfaces are extremely smooth and exhibit low friction, yet they retain the extreme wear and chemical resistance and inertness, which is critical when imaging soft material. Here are the properties of these tips:

    • Scanning soft and hard surfaces in contact mode
    • Quality control
    • Long tip life time
    • Bio friendly due to its low surface energy which leads to superior imaging performance on soft, sticky samples such as protein, polymers, DNA, viruses, bacteria and cells
    • Resist fouling and build-up of debris when imaging soft material
    • Low friction which inhibits sample damage during imaging
  • Multiprobe contact 48 Bio

    , $50.00

    Probe Data Sheet

    Cantilever arrays of silicon nitride probes designed for a variety of applications


  • Conductive Contact Mode

    From: $950.00

    Data Sheet

    These probes are designed for conducting scanning probe microscopy (C-AFM), Oxidation lithography, E-Chem AFM, Piezo-Force microscopy and SSRM. These probes feature high electrical conductivity and they are not like the metal coated probes.  These probes are totally conductive.  Additionally, the apex of less than 10 nm radius is respectively sharp when compared to the metal coated probes which gives unprecedented topographic and electrical resolution. Here are the properties of these tips:

    • No tip wear/Extremely durable
    • No tip shape degradation
    • Low friction
    • Suitable for bio-applications
    • Enables unparalleled resolution


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