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  • Conductive Non-Contact Mode

    From: $950.00

    Data Sheet

    These probes are designed for non-contact imaging, C-AFM, oxidation lithography, nano-indentation and nano-scratching applications. Can be used also for imaging in contact mode in air or liquid on hard surfaces. Here are the properties of these tips:

    • Extreme hardness, for indenting many surfaces
    • Extreme wear resistance, no change after many scans
    • Extremely strong, as strong as a single-crystal diamond
    • Very low friction, coefficients of friction 0.03 in air
    • Low stickiness, Hydrophobic surface