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Conductive Non-Contact Mode
Diamond Probes From: $950.00These probes are designed for non-contact imaging, C-AFM, oxidation lithography, nano-indentation and nano-scratching applications. Can be used also for imaging in contact mode in air or liquid on hard surfaces. Here are the properties of these tips:
- Extreme hardness, for indenting many surfaces
- Extreme wear resistance, no change after many scans
- Extremely strong, as strong as a single-crystal diamond
- Very low friction, coefficients of friction 0.03 in air
- Low stickiness, Hydrophobic surface