Product Description
Probe Type, C
Probe Design, Multiple Cantilever
Cantilever arrays of silicon nitride probes designed for a variety of applications.
- Side C-1: 5-cantilever array with 4 of the cantilevers designed for multi-patterning, referred to as fabrication probes. The wider cantilever is designed for laser alignment and imaging.
- Side C-2: 2 different arrays: Probe array C-2a (on the top right) is a simple 2-cantilever array. Probe array C-2b (on the bottom right) is similar to C-1, but is a stiffer array of 10 fabrication probes and 1 imaging probes
Note: Probes bought in quantities greater than 300 will be supplied in a wafer format. A chip cracker kit is highly recommend and is available under Accessories as shown under related products.
Nominal Specifications
Probe |
# Fabrication Probes |
Pitch (µm) |
Imaging k (N/m) |
Imaging Length (µm) |
Imaging Width (µm) |
Fabrication k (N/m) |
Fabrication Length (µm) |
Fabrication Width (µm) |
C-1 |
3 |
30 |
0.06 |
175 |
45 |
0.03 |
175 |
25 |
C-2a |
2 |
60 |
0.1 |
150 |
45 |
|||
C-2b |
10 |
35 |
0.06 |
175 |
45 |
0.05 |
150 |
25 |
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