Product Description
Probe Type, F
Probe Design, Multiple Cantilever
Cantilever arrays of silicon nitride probes designed for a variety of applications.
Side F-2: 52-cantilever array featuring 50 fabrication probes and 2 imaging probes. The multiple probes of the F-1 and F-2 sides are higher density probe arrays with lower spring constants making them ideal for high throughput fabrication on soft surfaces
Side F-1: 26-cantilever array featuring 24 designed for fabrication, referred to as “fabrication” pens. On the left and edge of the fabrication probes array is a “imaging” probe designed for imaging
Note: Probes bought in quantities greater than 300 will be supplied in a wafer format. A chip cracker kit is highly recommend and is available under Accessories as shown under related products.
Nominal Specifications
Probe |
# Fabrication Probes |
Pitch (µm) |
Imaging k (N/m) |
Imaging Length (µm) |
Imaging Width (µm) |
Fabrication k (N/m) |
Fabrication Length (µm) |
Fabrication Width (µm) |
|
F-1 |
24 |
35 |
0.097 |
150 |
45 |
0.05 |
150 |
25 |
|
F-2 |
50 |
23 |
0.097 |
150 |
45 |
<0.03 |
150 |
20 |
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