Probe F

$25.00

Probe Data Sheet

Cantilever arrays of silicon nitride probes designed for a variety of applications

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  • Description

    Product Description

    Probe Type, F

    Probe Design, Multiple Cantilever

    Cantilever arrays of silicon nitride probes designed for a variety of applications.

    Side F-2: 52-cantilever array featuring 50 fabrication probes and 2 imaging probes. The multiple probes of the F-1 and F-2 sides are higher density probe arrays with lower spring constants making them ideal for high throughput fabrication on soft surfaces

    Side F-1: 26-cantilever array featuring 24 designed for fabrication, referred to as “fabrication” pens. On the left and edge of the fabrication probes array is a “imaging” probe designed for imaging

    Note: Probes bought in quantities greater than 300 will be supplied in a wafer format. A chip cracker kit is highly recommend and is available under Accessories as shown under related products.

     

    Nominal Specifications

    Probe

    # Fabrication Probes

    Pitch (µm)

    Imaging k (N/m)

    Imaging Length (µm)

    Imaging Width (µm)

    Fabrication k (N/m)

    Fabrication Length (µm)

    Fabrication Width

    (µm)

    F-1

    24

    35

    0.097

    150

    45

    0.05

    150

    25

    F-2

    50

    23

    0.097

    150

    45

    <0.03

    150

    20

     

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