Product Description
Probe Type: E
Probe Design: Multiple Cantilever
Cantilever arrays of silicon nitride probes designed for a variety of applications.
Side E-1: 2 different 3-cantilever arrays. Probes E-1a (to the left) are shorter and wider with a higher spring constant. Probes E-1b (to the right) are longer and narrower with a lower spring constant.
Side E-2: 18-cantilever array for multi-fabrication with the same properties as the E-1a probes.
Note: Probes bought in quantities greater than 300 will be supplied in a wafer format. A chip cracker kit is highly recommend and is available under Accessories as shown under related products.
Nominal Specifications
Probe |
# Fabrication Probes |
Pitch (µm) |
Imaging k (N/m) |
Imaging Length (µm) |
Imaging Width (µm) |
Fabrication k (N/m) |
Fabrication Length (µm) |
Fabrication Width (µm) |
E-1a |
3 |
70 |
0.1 |
150 |
50 |
|||
E-1b |
3 |
70 |
0.04 |
200 |
45 |
|||
E-2 |
18 |
70 |
0.1 |
150 |
50 |
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